Nanomovies : Rapid Atomic Force Microscope

May 7th, 2005 | Filed under: Mechanical Tech, Nanotech, Photography, Technology, Video | No Comments »

Moshiur Anwar and Itay Rousso have demonstrated an atomic force microscope (AFM) that can take images of periodic processes with a time resolution of microseconds. Instead of sampling a surface by moving the microscopic probe, the probe is kept stationary in “force-sensing” mode as it records changes in up and down movements over time. The technique can only record repetitive nano-scaled movements which allow the microscope to move over and continue sampling the same movement for every pixel of the final constructed movie.

via physicsweb| Tech Review

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